Crime scene from fingerprints to DNA testing, an astonishing inside look at the real world of c.s.i.

Bibliographic Details
Main Author: Ragle
Corporate Author: Copyright Paperback Collection (Library of Congress)
Format: Book
Language:English
Published: New York, N.Y. Avon Books c2002.
Series:True crime (Avon Books)
Subjects:

PU Butterworth(TUDM BUTTERWORTH)

Holdings details from PU Butterworth(TUDM BUTTERWORTH)
Accession Item Category Format Status Notes
B000012668 Umum BOOKS AVAILABLE