Accelerated testing statistical models, test plans and data analyses
Main Author: | |
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Format: | Book |
Language: | English |
Published: |
New York
Wiley
c1990.
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Series: | Wiley series in probability and mathematical statistics. Applied probability and statistics
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Subjects: |
Item Description: | "A Wiley-Interscience publication." |
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Physical Description: | xiv, 601 p. ill. 25 cm. |
Bibliography: | Includes bibliographical references (p. 561-577). |
ISBN: | 0471522775 |