Electrical properties of neutron-irradiated silicon and GaAs commercial diodes
Neutron radiation testing was performed on silicon and GaAs diodes to investigate changes in the device parameters after neutron exposure. Californium-252 source was used to irradiate these diodes up to total dose of 1117.87mSv. The effects of nuclear radiation on the forward and reverse current-vol...
Main Authors: | , , , |
---|---|
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2012
|
Subjects: | |
Online Access: | http://irep.iium.edu.my/29528/ http://irep.iium.edu.my/29528/ http://irep.iium.edu.my/29528/1/electrical_properties.pdf |
id |
iium-29528 |
---|---|
recordtype |
eprints |
spelling |
iium-295282013-09-18T02:48:19Z http://irep.iium.edu.my/29528/ Electrical properties of neutron-irradiated silicon and GaAs commercial diodes Che Omar, Nuurul Iffah Hasbullah, Nurul Fadzlin Alang Md Rashid, Nahrul Khair Abdullah , Jaafar TK Electrical engineering. Electronics Nuclear engineering Neutron radiation testing was performed on silicon and GaAs diodes to investigate changes in the device parameters after neutron exposure. Californium-252 source was used to irradiate these diodes up to total dose of 1117.87mSv. The effects of nuclear radiation on the forward and reverse current-voltage (I-V) characteristics of Silicon and GaAs diodes were studied at room temperature. It was found that the magnitudes of forward bias electrical characteristics were in most instances unaffected by irradiation in both materials. The increments in TSKS5400S GaAs infrared emitting diode reverse currents were large after irradiation. These changes were interpreted as effects of displacement damage generating generation-recombination currents due to defects created. However, reverse bias (RB) characteristics of 1N4148 silicon diodes showed decrement in dark current. This is attributed to the type of diodes used. 2012 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/29528/1/electrical_properties.pdf Che Omar, Nuurul Iffah and Hasbullah, Nurul Fadzlin and Alang Md Rashid, Nahrul Khair and Abdullah , Jaafar (2012) Electrical properties of neutron-irradiated silicon and GaAs commercial diodes. In: 2012 IEEE Symposium on Industrial Electronics & Applications (ISIEA), 23-26 Sept. 2012 , Bandung, Indonesia. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6496678&tag=1 |
repository_type |
Digital Repository |
institution_category |
Local University |
institution |
International Islamic University Malaysia |
building |
IIUM Repository |
collection |
Online Access |
language |
English |
topic |
TK Electrical engineering. Electronics Nuclear engineering |
spellingShingle |
TK Electrical engineering. Electronics Nuclear engineering Che Omar, Nuurul Iffah Hasbullah, Nurul Fadzlin Alang Md Rashid, Nahrul Khair Abdullah , Jaafar Electrical properties of neutron-irradiated silicon and GaAs commercial diodes |
description |
Neutron radiation testing was performed on silicon and GaAs diodes to investigate changes in the device parameters after neutron exposure. Californium-252 source was used to irradiate these diodes up to total dose of 1117.87mSv. The effects of nuclear radiation on the forward and reverse current-voltage (I-V) characteristics of Silicon and GaAs diodes were studied at room temperature. It was found that the magnitudes of forward bias electrical characteristics were in most instances unaffected by irradiation in both materials. The increments in TSKS5400S GaAs infrared emitting diode reverse currents were large after irradiation. These changes were interpreted as effects of displacement damage generating generation-recombination currents due to defects created. However, reverse bias (RB) characteristics of 1N4148 silicon diodes showed decrement in dark current. This is attributed to the type of diodes used. |
format |
Conference or Workshop Item |
author |
Che Omar, Nuurul Iffah Hasbullah, Nurul Fadzlin Alang Md Rashid, Nahrul Khair Abdullah , Jaafar |
author_facet |
Che Omar, Nuurul Iffah Hasbullah, Nurul Fadzlin Alang Md Rashid, Nahrul Khair Abdullah , Jaafar |
author_sort |
Che Omar, Nuurul Iffah |
title |
Electrical properties of neutron-irradiated silicon and GaAs commercial diodes |
title_short |
Electrical properties of neutron-irradiated silicon and GaAs commercial diodes |
title_full |
Electrical properties of neutron-irradiated silicon and GaAs commercial diodes |
title_fullStr |
Electrical properties of neutron-irradiated silicon and GaAs commercial diodes |
title_full_unstemmed |
Electrical properties of neutron-irradiated silicon and GaAs commercial diodes |
title_sort |
electrical properties of neutron-irradiated silicon and gaas commercial diodes |
publishDate |
2012 |
url |
http://irep.iium.edu.my/29528/ http://irep.iium.edu.my/29528/ http://irep.iium.edu.my/29528/1/electrical_properties.pdf |
first_indexed |
2023-09-18T20:43:21Z |
last_indexed |
2023-09-18T20:43:21Z |
_version_ |
1777409512180809728 |