Development of low normal force contact using electro fine forming and lithography technology

This new technology is realized by Photo Resist Lithography and NiCo Electro Fine Forming Process, and enables the design of a small contact spring for applications requiring high density, high speed and high durability. The evaluation result proved the capability of Low Normal Force (0.10N-0.15N at...

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Bibliographic Details
Main Authors: Bhuiyan, Moinul, Yamada, Shinji, Kurokawa, Noriharu, Sakamoto, Katsuhiko, Takemasa, Eiichiro
Format: Conference or Workshop Item
Language:English
English
Published: 2008
Subjects:
Online Access:http://irep.iium.edu.my/33190/
http://irep.iium.edu.my/33190/
http://irep.iium.edu.my/33190/1/Development_of_Low_Normal_Force_Contact_Using_Electro_Fine_Forming_and_Lithography_Technology.pdf
http://irep.iium.edu.my/33190/4/TE_Technical_Conference_2008.jpg
Description
Summary:This new technology is realized by Photo Resist Lithography and NiCo Electro Fine Forming Process, and enables the design of a small contact spring for applications requiring high density, high speed and high durability. The evaluation result proved the capability of Low Normal Force (0.10N-0.15N at 0.3mm) at contact point (5μm radius), durability of 100,000 contact cycles (less than 50mΩ).