A low normal force contact using photolithography and Ni-Co electro fine forming technology

This new technology is realized by Photo Resist Lithography and Ni-Co Electro Fine Forming technology, and enables the design of a small contact spring for applications requiring high density, high speed and high durability. The evaluation result proved the capability of Low Normal Force (0.10N-0....

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Main Authors: Bhuiyan , Moinul, Takemasa, Eiichiro
Format: Conference or Workshop Item
Language:English
English
Published: 2009
Subjects:
Online Access:http://irep.iium.edu.my/33437/
http://irep.iium.edu.my/33437/1/A_Low_Normal_Force_Contact_using_Photolithography_and_Ni-Co_Electro_Fine_Forming_Technology.pdf
http://irep.iium.edu.my/33437/2/Tech._Paper_Conf._Spring2009_20090515.pdf
id iium-33437
recordtype eprints
spelling iium-334372013-12-18T04:45:06Z http://irep.iium.edu.my/33437/ A low normal force contact using photolithography and Ni-Co electro fine forming technology Bhuiyan , Moinul Takemasa, Eiichiro TA165 Engineering instruments, meters, etc. Industrial instrumentation This new technology is realized by Photo Resist Lithography and Ni-Co Electro Fine Forming technology, and enables the design of a small contact spring for applications requiring high density, high speed and high durability. The evaluation result proved the capability of Low Normal Force (0.10N-0.15N at 0.3mm) at contact point (5μm radius), durability of 100,000 contact cycles (less than 50m�). The particle size of the Ni-Co crystal must be less than 100nm as measured by STEM. 2009-05-14 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/33437/1/A_Low_Normal_Force_Contact_using_Photolithography_and_Ni-Co_Electro_Fine_Forming_Technology.pdf application/pdf en http://irep.iium.edu.my/33437/2/Tech._Paper_Conf._Spring2009_20090515.pdf Bhuiyan , Moinul and Takemasa, Eiichiro (2009) A low normal force contact using photolithography and Ni-Co electro fine forming technology. In: TE-Japan Technical Conference, 14 May 2009, Kawasaki, Japan.
repository_type Digital Repository
institution_category Local University
institution International Islamic University Malaysia
building IIUM Repository
collection Online Access
language English
English
topic TA165 Engineering instruments, meters, etc. Industrial instrumentation
spellingShingle TA165 Engineering instruments, meters, etc. Industrial instrumentation
Bhuiyan , Moinul
Takemasa, Eiichiro
A low normal force contact using photolithography and Ni-Co electro fine forming technology
description This new technology is realized by Photo Resist Lithography and Ni-Co Electro Fine Forming technology, and enables the design of a small contact spring for applications requiring high density, high speed and high durability. The evaluation result proved the capability of Low Normal Force (0.10N-0.15N at 0.3mm) at contact point (5μm radius), durability of 100,000 contact cycles (less than 50m�). The particle size of the Ni-Co crystal must be less than 100nm as measured by STEM.
format Conference or Workshop Item
author Bhuiyan , Moinul
Takemasa, Eiichiro
author_facet Bhuiyan , Moinul
Takemasa, Eiichiro
author_sort Bhuiyan , Moinul
title A low normal force contact using photolithography and Ni-Co electro fine forming technology
title_short A low normal force contact using photolithography and Ni-Co electro fine forming technology
title_full A low normal force contact using photolithography and Ni-Co electro fine forming technology
title_fullStr A low normal force contact using photolithography and Ni-Co electro fine forming technology
title_full_unstemmed A low normal force contact using photolithography and Ni-Co electro fine forming technology
title_sort low normal force contact using photolithography and ni-co electro fine forming technology
publishDate 2009
url http://irep.iium.edu.my/33437/
http://irep.iium.edu.my/33437/1/A_Low_Normal_Force_Contact_using_Photolithography_and_Ni-Co_Electro_Fine_Forming_Technology.pdf
http://irep.iium.edu.my/33437/2/Tech._Paper_Conf._Spring2009_20090515.pdf
first_indexed 2023-09-18T20:48:20Z
last_indexed 2023-09-18T20:48:20Z
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