A modular system of deep level transient spectroscopy

A modular system of deep level transient spectroscopy

Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequenc...

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Bibliographic Details
Main Authors: Rusli, Nazreen, Debuf, Didier
Format: Conference or Workshop Item
Language:English
Published: 2011
Subjects:
QC Physics
Online Access:http://irep.iium.edu.my/36427/
http://irep.iium.edu.my/36427/
http://irep.iium.edu.my/36427/1/iccaie.pdf
id iium-36427
recordtype eprints
spelling iium-364272014-04-25T07:30:30Z http://irep.iium.edu.my/36427/ A modular system of deep level transient spectroscopy Rusli, Nazreen Debuf, Didier QC Physics Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth. 2011-12-04 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/36427/1/iccaie.pdf Rusli, Nazreen and Debuf, Didier (2011) A modular system of deep level transient spectroscopy. In: 2011 IEEE International Conference on Computer Applications and Industrial Electronics (ICCAIE 2011), 4-7 Dec. 2011, Penang. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6162137&tag=1
repository_type Digital Repository
institution_category Local University
institution International Islamic University Malaysia
building IIUM Repository
collection Online Access
language English
topic QC Physics
spellingShingle QC Physics
Rusli, Nazreen
Debuf, Didier
A modular system of deep level transient spectroscopy
description Deep Level Transient Spectroscopy (DLTS) is a technique to determine the electrical characteristics of an electrically active defect in a semiconductor. A measurement system is developed to detect defects in a semiconductor in a LabView environment. A more accurate method namely Fundamental Frequency Deep Level Transient Spectroscopy (FFDLTS) is proposed as one of the methods to analyze the defect level depth.
format Conference or Workshop Item
author Rusli, Nazreen
Debuf, Didier
author_facet Rusli, Nazreen
Debuf, Didier
author_sort Rusli, Nazreen
title A modular system of deep level transient spectroscopy
title_short A modular system of deep level transient spectroscopy
title_full A modular system of deep level transient spectroscopy
title_fullStr A modular system of deep level transient spectroscopy
title_full_unstemmed A modular system of deep level transient spectroscopy
title_sort modular system of deep level transient spectroscopy
publishDate 2011
url http://irep.iium.edu.my/36427/
http://irep.iium.edu.my/36427/
http://irep.iium.edu.my/36427/1/iccaie.pdf
first_indexed 2023-09-18T20:52:11Z
last_indexed 2023-09-18T20:52:11Z
_version_ 1777410068275265536

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