APA (7th ed.) Citation

Abubakkar, S. F. O., Hasbullah, N. F., Zabah, N. F., & Abdullah, Y. (2014). 3MeV-electron beam induced threshold voltage shifts and drain current degradation on ZVN3320FTA & ZVP3310FTA commercial MOSFETs.

Chicago Style (17th ed.) Citation

Abubakkar, Sheik Fareed Ookar, Nurul Fadzlin Hasbullah, Nor Farahidah Zabah, and Yusof Abdullah. 3MeV-electron Beam Induced Threshold Voltage Shifts and Drain Current Degradation on ZVN3320FTA & ZVP3310FTA Commercial MOSFETs. 2014.

MLA (8th ed.) Citation

Abubakkar, Sheik Fareed Ookar, et al. 3MeV-electron Beam Induced Threshold Voltage Shifts and Drain Current Degradation on ZVN3320FTA & ZVP3310FTA Commercial MOSFETs. 2014.