Tian, G. Y., & Sophian, A. (2005). Defect classification using a new feature for pulsed eddy current sensors. Elsevier.
Chicago Style (17th ed.) CitationTian, Gui Yun, and Ali Sophian. Defect Classification Using a New Feature for Pulsed Eddy Current Sensors. Elsevier, 2005.
MLA (8th ed.) CitationTian, Gui Yun, and Ali Sophian. Defect Classification Using a New Feature for Pulsed Eddy Current Sensors. Elsevier, 2005.
Warning: These citations may not always be 100% accurate.