APA (7th ed.) Citation

Edwards, R., Sophian, A., Dixon, S., Tian, G., & Jian, X. (2006). Dual EMAT and PEC non-contact probe: Applications to defect testing. Elsevier.

Chicago Style (17th ed.) Citation

Edwards, R.S, Ali Sophian, S. Dixon, G.-Y Tian, and X. Jian. Dual EMAT and PEC Non-contact Probe: Applications to Defect Testing. Elsevier, 2006.

MLA (8th ed.) Citation

Edwards, R.S, et al. Dual EMAT and PEC Non-contact Probe: Applications to Defect Testing. Elsevier, 2006.