Spiral-scan atomic force microscopy: a constant linear velocity approach

This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with sl...

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Main Authors:	Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format:	Conference or Workshop Item
Language:	English
Published:	2010
Subjects:	Q Science (General) TJ212 Control engineering
Online Access:	http://irep.iium.edu.my/5303/ http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf

id	iium-5303
recordtype	eprints
spelling	iium-53032011-11-01T01:19:26Z http://irep.iium.edu.my/5303/ Spiral-scan atomic force microscopy: a constant linear velocity approach Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Q Science (General) TJ212 Control engineering This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an AFM scanner respectively. In order to ensure that the spiral trajectory travels at a constant linear velocity (CLV), frequency and amplitude of the input signals are varied simultaneously in a way that the linear velocity of the scanner is kept constant. Experimental results obtained by implementing the CLV spiral scan on a commercial AFM indicate that, compared with the raster-scan method, high-quality AFM images of equal area and pitch can be generated two times faster and using half of the total traveled distance. 2010-08 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2010) Spiral-scan atomic force microscopy: a constant linear velocity approach. In: 10th IEEE International Conference on Nanotechnology Joint Symposium with Nano Korea, 17 - 20 August 2010, KINTEX, Korea.
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	Q Science (General) TJ212 Control engineering
spellingShingle	Q Science (General) TJ212 Control engineering Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Spiral-scan atomic force microscopy: a constant linear velocity approach
description	This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with slowly varying amplitudes to the x-axis and y-axis of an AFM scanner respectively. In order to ensure that the spiral trajectory travels at a constant linear velocity (CLV), frequency and amplitude of the input signals are varied simultaneously in a way that the linear velocity of the scanner is kept constant. Experimental results obtained by implementing the CLV spiral scan on a commercial AFM indicate that, compared with the raster-scan method, high-quality AFM images of equal area and pitch can be generated two times faster and using half of the total traveled distance.
format	Conference or Workshop Item
author	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza
author_facet	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza
author_sort	Mahmood, Iskandar Al-Thani
title	Spiral-scan atomic force microscopy: a constant linear velocity approach
title_short	Spiral-scan atomic force microscopy: a constant linear velocity approach
title_full	Spiral-scan atomic force microscopy: a constant linear velocity approach
title_fullStr	Spiral-scan atomic force microscopy: a constant linear velocity approach
title_full_unstemmed	Spiral-scan atomic force microscopy: a constant linear velocity approach
title_sort	spiral-scan atomic force microscopy: a constant linear velocity approach
publishDate	2010
url	http://irep.iium.edu.my/5303/ http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf
first_indexed	2023-09-18T20:13:49Z
last_indexed	2023-09-18T20:13:49Z
_version_	1777407654438633472

Spiral-scan atomic force microscopy: a constant linear velocity approach

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