APA (7th ed.) Citation

Hatta, S. W. M., Hussin, H. Y., Soon, F., Abdul Wahab, Y., Abdul Hadi, D., Soin, N., . . . Nordin, A. N. (2017). Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET. IEEE.

Chicago Style (17th ed.) Citation

Hatta, Sharifah Wan M., Hanim Yati Hussin, F.Y Soon, Yasmin Abdul Wahab, Dayanasari Abdul Hadi, Norhayati Soin, A. H.M.Zahirul Alam, and Anis Nurashikin Nordin. Negative Bias Temperature Instability Characterization and Lifetime Evaluations of Submicron PMOSFET. IEEE, 2017.

MLA (8th ed.) Citation

Hatta, Sharifah Wan M., et al. Negative Bias Temperature Instability Characterization and Lifetime Evaluations of Submicron PMOSFET. IEEE, 2017.