An effective vision technique for microchip lead inspection
A new effective method for the microchip lead inspection for the chip manufacturing industry has been developed in this work. In contrast to the gray scale pattern matching technique this approach employs selected parameters of binary blobs to perform fault detection and measurements. This lead...
| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2003
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/6943/ http://irep.iium.edu.my/6943/1/An_Effective_Vision_Technique_for_Microchip_Lead_Inspection.pdf |