Fuzzy based technique for microchip lead inspection using machine vision
This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the fea...
| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2008
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/6952/ http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf |
| Summary: | This research develops a fuzzy based algorithm for
microchip image lead Inspection. Leads are inspected
for count, planarity, offset, pitch and span defects.
Firstly, it utilizes fast preprocessing techniques and
blobs’ features extraction methods to achieve high
inspection rates. Using the features extracted, the
algorithm first finds a proper thresholding value. It
then applies Fuzzy logic to make a decision on the
status of the IC based on these features. The algorithm
proposes a structured way for building the fuzzy
systems as well as the associated set of inference rules. |
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