Fuzzy based technique for microchip lead inspection using machine vision

This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the fea...

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Main Authors: Hawari, Yasser, Salami, Momoh Jimoh Emiyoka, Aburas, Abdurazzag Ali
Format: Conference or Workshop Item
Language:English
Published: 2008
Subjects:
Online Access:http://irep.iium.edu.my/6952/
http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf
id iium-6952
recordtype eprints
spelling iium-69522012-08-09T03:19:12Z http://irep.iium.edu.my/6952/ Fuzzy based technique for microchip lead inspection using machine vision Hawari, Yasser Salami, Momoh Jimoh Emiyoka Aburas, Abdurazzag Ali T Technology (General) This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the features extracted, the algorithm first finds a proper thresholding value. It then applies Fuzzy logic to make a decision on the status of the IC based on these features. The algorithm proposes a structured way for building the fuzzy systems as well as the associated set of inference rules. 2008 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf Hawari, Yasser and Salami, Momoh Jimoh Emiyoka and Aburas, Abdurazzag Ali (2008) Fuzzy based technique for microchip lead inspection using machine vision. In: International Conference on Computer and Communication Engineering 2008, 13 -15 May 2008 , Kuala Lumpur, Malaysia.
repository_type Digital Repository
institution_category Local University
institution International Islamic University Malaysia
building IIUM Repository
collection Online Access
language English
topic T Technology (General)
spellingShingle T Technology (General)
Hawari, Yasser
Salami, Momoh Jimoh Emiyoka
Aburas, Abdurazzag Ali
Fuzzy based technique for microchip lead inspection using machine vision
description This research develops a fuzzy based algorithm for microchip image lead Inspection. Leads are inspected for count, planarity, offset, pitch and span defects. Firstly, it utilizes fast preprocessing techniques and blobs’ features extraction methods to achieve high inspection rates. Using the features extracted, the algorithm first finds a proper thresholding value. It then applies Fuzzy logic to make a decision on the status of the IC based on these features. The algorithm proposes a structured way for building the fuzzy systems as well as the associated set of inference rules.
format Conference or Workshop Item
author Hawari, Yasser
Salami, Momoh Jimoh Emiyoka
Aburas, Abdurazzag Ali
author_facet Hawari, Yasser
Salami, Momoh Jimoh Emiyoka
Aburas, Abdurazzag Ali
author_sort Hawari, Yasser
title Fuzzy based technique for microchip lead inspection using machine vision
title_short Fuzzy based technique for microchip lead inspection using machine vision
title_full Fuzzy based technique for microchip lead inspection using machine vision
title_fullStr Fuzzy based technique for microchip lead inspection using machine vision
title_full_unstemmed Fuzzy based technique for microchip lead inspection using machine vision
title_sort fuzzy based technique for microchip lead inspection using machine vision
publishDate 2008
url http://irep.iium.edu.my/6952/
http://irep.iium.edu.my/6952/1/Fuzzy_Based_Technique_for_Microchip_Lead_Inspection_Using_Machine_Vision.pdf
first_indexed 2023-09-18T20:16:07Z
last_indexed 2023-09-18T20:16:07Z
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