APA (7th ed.) Citation

Yusop, N. S., Nordin, A. N., Khairi, M. A., & Hasbullah, N. F. (2018). The impact of scaling on single event upset in 6T and 12T SRAMs from 130 to 22 nm CMOS technology. Taylor & Francis.

Chicago Style (17th ed.) Citation

Yusop, N. S., Anis Nurashikin Nordin, M. Azim Khairi, and Nurul Fadzlin Hasbullah. The Impact of Scaling on Single Event Upset in 6T and 12T SRAMs from 130 to 22 Nm CMOS Technology. Taylor & Francis, 2018.

MLA (8th ed.) Citation

Yusop, N. S., et al. The Impact of Scaling on Single Event Upset in 6T and 12T SRAMs from 130 to 22 Nm CMOS Technology. Taylor & Francis, 2018.