Mohd Khairi, M. A., Abdullah, Y., Ab Rahim, R., & Hasbullah, N. F. (2019). Durability of 4H-SiC Schottky power diodes irradiated with high-energy bombarding electrons. The Institution of Engineering and Technology (IET).
Chicago Style (17th ed.) CitationMohd Khairi, Mohamad Azim, Yusof Abdullah, Rosminazuin Ab Rahim, and Nurul Fadzlin Hasbullah. Durability of 4H-SiC Schottky Power Diodes Irradiated with High-energy Bombarding Electrons. The Institution of Engineering and Technology (IET), 2019.
MLA (8th ed.) CitationMohd Khairi, Mohamad Azim, et al. Durability of 4H-SiC Schottky Power Diodes Irradiated with High-energy Bombarding Electrons. The Institution of Engineering and Technology (IET), 2019.
Warning: These citations may not always be 100% accurate.