Novel characterization technique by using an SEM

Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron...

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Main Authors:	Sutjipto, Agus Geter Edy, -, Jufriadi, Muhida, Riza, Takata, Masasuke
Format:	Conference or Workshop Item
Language:	English
Published:	2008
Subjects:	TK452 Electric apparatus and materials. Electric circuits. Electric networks
Online Access:	http://irep.iium.edu.my/9393/ http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf

id	iium-9393
recordtype	eprints
spelling	iium-93932012-04-06T07:18:53Z http://irep.iium.edu.my/9393/ Novel characterization technique by using an SEM Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke TK452 Electric apparatus and materials. Electric circuits. Electric networks Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment. 2008 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf Sutjipto, Agus Geter Edy and -, Jufriadi and Muhida, Riza and Takata, Masasuke (2008) Novel characterization technique by using an SEM. In: XXIII-rd Int. Symp. on Discharges and Electrical Insulation in Vacuum (ISDEIV 2008), 15 - 19 September 2008, Bucharest, Romania.
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	TK452 Electric apparatus and materials. Electric circuits. Electric networks
spellingShingle	TK452 Electric apparatus and materials. Electric circuits. Electric networks Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke Novel characterization technique by using an SEM
description	Charging and discharging phenomenon on the surface of materials can be found in plasma display panel, spacecraft charging, high voltage insulator, etc. This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. A model of electric field distribution on the surface was developed in order to explain charging and discharging phenomena. Since charging and discharging process involves incubation time, therefore this process can be used to characterize or evaluate the insulation property of materials under electron bombardment.
format	Conference or Workshop Item
author	Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke
author_facet	Sutjipto, Agus Geter Edy -, Jufriadi Muhida, Riza Takata, Masasuke
author_sort	Sutjipto, Agus Geter Edy
title	Novel characterization technique by using an SEM
title_short	Novel characterization technique by using an SEM
title_full	Novel characterization technique by using an SEM
title_fullStr	Novel characterization technique by using an SEM
title_full_unstemmed	Novel characterization technique by using an SEM
title_sort	novel characterization technique by using an sem
publishDate	2008
url	http://irep.iium.edu.my/9393/ http://irep.iium.edu.my/9393/1/AGUS_-_Proc_ISDEV_-_2008.pdf
first_indexed	2023-09-18T20:19:05Z
last_indexed	2023-09-18T20:19:05Z
_version_	1777407985867292672

Novel characterization technique by using an SEM

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