Dark Current mechanisms in quantum dot laser structures

Current-voltage measurements have been performed on InAs/InGaAs/GaAs quantum dot structures with varying growth and design parameters. These measurements show that the forward and reverse bias dark currents decrease with increasing spacer growth temperature, however, they are relatively insensitive...

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Main Authors: Hasbullah, Nurul Fadzlin, David, J. P. R., Mowbray, D. J.
Format: Article
Language:English
Published: American Institute of Physics 2011
Subjects:
Online Access:http://irep.iium.edu.my/9816/
http://irep.iium.edu.my/9816/
http://irep.iium.edu.my/9816/
http://irep.iium.edu.my/9816/1/Dark_Current_Mechanism.pdf
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spelling iium-98162012-05-24T14:27:50Z http://irep.iium.edu.my/9816/ Dark Current mechanisms in quantum dot laser structures Hasbullah, Nurul Fadzlin David, J. P. R. Mowbray, D. J. TK7885 Computer engineering Current-voltage measurements have been performed on InAs/InGaAs/GaAs quantum dot structures with varying growth and design parameters. These measurements show that the forward and reverse bias dark currents decrease with increasing spacer growth temperature, however, they are relatively insensitive to the number of periods of the quantum dot layers. Temperature dependent current-voltage measurements show that the mechanism that governs the reverse bias leakage current is due to generation-recombination via mid-band traps assisted by the Frenkel-Poole emission of carriers from these traps. American Institute of Physics 2011 Article PeerReviewed application/pdf en http://irep.iium.edu.my/9816/1/Dark_Current_Mechanism.pdf Hasbullah, Nurul Fadzlin and David, J. P. R. and Mowbray, D. J. (2011) Dark Current mechanisms in quantum dot laser structures. Journal of Applied Physics, 109 (11). pp. 113111-1. ISSN 0021-8979 http://jap.aip.org/resource/1/japiau/v109/i11/p113111_s1?isAuthorized=no DOI: 10.1063/1.3596524
repository_type Digital Repository
institution_category Local University
institution International Islamic University Malaysia
building IIUM Repository
collection Online Access
language English
topic TK7885 Computer engineering
spellingShingle TK7885 Computer engineering
Hasbullah, Nurul Fadzlin
David, J. P. R.
Mowbray, D. J.
Dark Current mechanisms in quantum dot laser structures
description Current-voltage measurements have been performed on InAs/InGaAs/GaAs quantum dot structures with varying growth and design parameters. These measurements show that the forward and reverse bias dark currents decrease with increasing spacer growth temperature, however, they are relatively insensitive to the number of periods of the quantum dot layers. Temperature dependent current-voltage measurements show that the mechanism that governs the reverse bias leakage current is due to generation-recombination via mid-band traps assisted by the Frenkel-Poole emission of carriers from these traps.
format Article
author Hasbullah, Nurul Fadzlin
David, J. P. R.
Mowbray, D. J.
author_facet Hasbullah, Nurul Fadzlin
David, J. P. R.
Mowbray, D. J.
author_sort Hasbullah, Nurul Fadzlin
title Dark Current mechanisms in quantum dot laser structures
title_short Dark Current mechanisms in quantum dot laser structures
title_full Dark Current mechanisms in quantum dot laser structures
title_fullStr Dark Current mechanisms in quantum dot laser structures
title_full_unstemmed Dark Current mechanisms in quantum dot laser structures
title_sort dark current mechanisms in quantum dot laser structures
publisher American Institute of Physics
publishDate 2011
url http://irep.iium.edu.my/9816/
http://irep.iium.edu.my/9816/
http://irep.iium.edu.my/9816/
http://irep.iium.edu.my/9816/1/Dark_Current_Mechanism.pdf
first_indexed 2023-09-18T20:19:26Z
last_indexed 2023-09-18T20:19:26Z
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