APA (7th ed.) Citation

Goh, B. T., Muhamad Rasat Muhamad, & Saadah Abdul Rahman. (2012). Effects of rf power on structural properties of Nc-Si: H thin films deposited by layer-by-layer (LbL) deposition technique. Universiti Kebangsaan Malaysia.

Chicago Style (17th ed.) Citation

Goh, Boon Tong, Muhamad Rasat Muhamad, and Saadah Abdul Rahman. Effects of Rf Power on Structural Properties of Nc-Si: H Thin Films Deposited by Layer-by-layer (LbL) Deposition Technique. Universiti Kebangsaan Malaysia, 2012.

MLA (8th ed.) Citation

Goh, Boon Tong, et al. Effects of Rf Power on Structural Properties of Nc-Si: H Thin Films Deposited by Layer-by-layer (LbL) Deposition Technique. Universiti Kebangsaan Malaysia, 2012.