Atomic force microscopy as a tool for asymmetric polymeric membrane characterization

Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research and development. This powerful technique has been used to visualize surfaces both in liquid or gas media. It has been considered as an effective tool to investigate the surface structure for its ability...

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Main Authors:	Abdul Wahab Mohammad, Nidal Hilal, Lim, Ying Pei, Indok Nurul Hasyimah Mohd Amin, Rafeqah Raslan
Format:	Article
Language:	English
Published:	Universiti Kebangsaan Malaysia 2011
Online Access:	http://journalarticle.ukm.my/704/ http://journalarticle.ukm.my/704/ http://journalarticle.ukm.my/704/1/08_Abdul_Wahab.pdf

id	ukm-704
recordtype	eprints
spelling	ukm-7042016-12-14T06:27:57Z http://journalarticle.ukm.my/704/ Atomic force microscopy as a tool for asymmetric polymeric membrane characterization Abdul Wahab Mohammad, Nidal Hilal, Lim, Ying Pei Indok Nurul Hasyimah Mohd Amin, Rafeqah Raslan, Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research and development. This powerful technique has been used to visualize surfaces both in liquid or gas media. It has been considered as an effective tool to investigate the surface structure for its ability to generate high-resolution 3D images at a subnanometer range without sample pretreatment. In this paper, the use of AFM to characterize the membrane roughness is presented for commercial and self-prepared membranes for specific applications. Surface roughness has been regarded as one of the most important surface properties, and has significant effect in membrane permeability and fouling behaviour. Several scan areas were used to compare surface roughness for different membrane samples. Characterization of the surfaces was achieved by measuring the average roughness (Ra) and root mean square roughness (Rrms) of the membrane. AFM image shows that the membrane surface was composed entirely of peaks and valleys. Surface roughness is substantially greater for commercial available hydrophobic membranes, in contrast to self-prepared membranes. This study also shows that foulants deposited on membrane surface would increase the membrane roughness. Universiti Kebangsaan Malaysia 2011-03 Article PeerReviewed application/pdf en http://journalarticle.ukm.my/704/1/08_Abdul_Wahab.pdf Abdul Wahab Mohammad, and Nidal Hilal, and Lim, Ying Pei and Indok Nurul Hasyimah Mohd Amin, and Rafeqah Raslan, (2011) Atomic force microscopy as a tool for asymmetric polymeric membrane characterization. Sains Malaysiana, 40 (3). pp. 237-244. ISSN 0126-6039 http://www.ukm.my/~jsm/
repository_type	Digital Repository
institution_category	Local University
institution	Universiti Kebangasaan Malaysia
building	UKM Institutional Repository
collection	Online Access
language	English
description	Atomic force microscopy (AFM) has a wide range of applications and is rapidly growing in research and development. This powerful technique has been used to visualize surfaces both in liquid or gas media. It has been considered as an effective tool to investigate the surface structure for its ability to generate high-resolution 3D images at a subnanometer range without sample pretreatment. In this paper, the use of AFM to characterize the membrane roughness is presented for commercial and self-prepared membranes for specific applications. Surface roughness has been regarded as one of the most important surface properties, and has significant effect in membrane permeability and fouling behaviour. Several scan areas were used to compare surface roughness for different membrane samples. Characterization of the surfaces was achieved by measuring the average roughness (Ra) and root mean square roughness (Rrms) of the membrane. AFM image shows that the membrane surface was composed entirely of peaks and valleys. Surface roughness is substantially greater for commercial available hydrophobic membranes, in contrast to self-prepared membranes. This study also shows that foulants deposited on membrane surface would increase the membrane roughness.
format	Article
author	Abdul Wahab Mohammad, Nidal Hilal, Lim, Ying Pei Indok Nurul Hasyimah Mohd Amin, Rafeqah Raslan,
spellingShingle	Abdul Wahab Mohammad, Nidal Hilal, Lim, Ying Pei Indok Nurul Hasyimah Mohd Amin, Rafeqah Raslan, Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
author_facet	Abdul Wahab Mohammad, Nidal Hilal, Lim, Ying Pei Indok Nurul Hasyimah Mohd Amin, Rafeqah Raslan,
author_sort	Abdul Wahab Mohammad,
title	Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_short	Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_full	Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_fullStr	Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_full_unstemmed	Atomic force microscopy as a tool for asymmetric polymeric membrane characterization
title_sort	atomic force microscopy as a tool for asymmetric polymeric membrane characterization
publisher	Universiti Kebangsaan Malaysia
publishDate	2011
url	http://journalarticle.ukm.my/704/ http://journalarticle.ukm.my/704/ http://journalarticle.ukm.my/704/1/08_Abdul_Wahab.pdf
first_indexed	2023-09-18T19:31:33Z
last_indexed	2023-09-18T19:31:33Z
_version_	1777404995299180544

Atomic force microscopy as a tool for asymmetric polymeric membrane characterization

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