X-Ray Topography
X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray...
| Main Authors: | , , |
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| Format: | Book Section |
| Language: | English English |
| Published: |
Elsevier
2016
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| Subjects: | |
| Online Access: | http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/1/fkm-2016-aqida-xray.pdf http://umpir.ump.edu.my/id/eprint/16224/7/fkm-2016-X-Ray%20Topography.pdf |
| Summary: | X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray beam when the Bragg condition is satisfied. Among the basic extended beam methods are integrated wave and plane wave topography. The integrated wave method includes white beam X-ray topography which is the Laue technique with low divergent, powerful, and broad incident beam. The advent of synchrotron radiation topography permits a fast and detailed study of defects in crystalline materials. |
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