X-Ray Topography

X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray...

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Main Authors:	Hartwig, J. B., Hartwig, J., S. N., Aqida
Format:	Book Section
Language:	English English
Published:	Elsevier 2016
Subjects:	TJ Mechanical engineering and machinery
Online Access:	http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/1/fkm-2016-aqida-xray.pdf http://umpir.ump.edu.my/id/eprint/16224/7/fkm-2016-X-Ray%20Topography.pdf

id	ump-16224
recordtype	eprints
spelling	ump-162242018-01-22T06:14:40Z http://umpir.ump.edu.my/id/eprint/16224/ X-Ray Topography Hartwig, J. B. Hartwig, J. S. N., Aqida TJ Mechanical engineering and machinery X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray beam when the Bragg condition is satisfied. Among the basic extended beam methods are integrated wave and plane wave topography. The integrated wave method includes white beam X-ray topography which is the Laue technique with low divergent, powerful, and broad incident beam. The advent of synchrotron radiation topography permits a fast and detailed study of defects in crystalline materials. Elsevier 2016 Book Section PeerReviewed application/pdf en http://umpir.ump.edu.my/id/eprint/16224/1/fkm-2016-aqida-xray.pdf application/pdf en http://umpir.ump.edu.my/id/eprint/16224/7/fkm-2016-X-Ray%20Topography.pdf Hartwig, J. B. and Hartwig, J. and S. N., Aqida (2016) X-Ray Topography. In: Reference Module in Materials Science and Materials Engineering. Elsevier, Oxford, pp. 1-9. ISBN 978-0-12-803581-8 http://dx.doi.org/10.1016/B978-0-12-803581-8.01228-5 DOI: 10.1016/B978-0-12-803581-8.01228-5
repository_type	Digital Repository
institution_category	Local University
institution	Universiti Malaysia Pahang
building	UMP Institutional Repository
collection	Online Access
language	English English
topic	TJ Mechanical engineering and machinery
spellingShingle	TJ Mechanical engineering and machinery Hartwig, J. B. Hartwig, J. S. N., Aqida X-Ray Topography
description	X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray beam when the Bragg condition is satisfied. Among the basic extended beam methods are integrated wave and plane wave topography. The integrated wave method includes white beam X-ray topography which is the Laue technique with low divergent, powerful, and broad incident beam. The advent of synchrotron radiation topography permits a fast and detailed study of defects in crystalline materials.
format	Book Section
author	Hartwig, J. B. Hartwig, J. S. N., Aqida
author_facet	Hartwig, J. B. Hartwig, J. S. N., Aqida
author_sort	Hartwig, J. B.
title	X-Ray Topography
title_short	X-Ray Topography
title_full	X-Ray Topography
title_fullStr	X-Ray Topography
title_full_unstemmed	X-Ray Topography
title_sort	x-ray topography
publisher	Elsevier
publishDate	2016
url	http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/ http://umpir.ump.edu.my/id/eprint/16224/1/fkm-2016-aqida-xray.pdf http://umpir.ump.edu.my/id/eprint/16224/7/fkm-2016-X-Ray%20Topography.pdf
first_indexed	2023-09-18T22:21:43Z
last_indexed	2023-09-18T22:21:43Z
_version_	1777415700461125632

X-Ray Topography

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