APA (7th ed.) Citation

Atalla, Y., Hashim, Y., Abdul Nasir, A. G., & Jabbar, W. A. (2019). A temperature characterization of (Si-FinFET) based on channel oxide thickness. Universitas Ahmad Dahlan.

Chicago Style (17th ed.) Citation

Atalla, Yousif, Yasir Hashim, Abd Ghafar Abdul Nasir, and Waheb A. Jabbar. A Temperature Characterization of (Si-FinFET) Based on Channel Oxide Thickness. Universitas Ahmad Dahlan, 2019.

MLA (8th ed.) Citation

Atalla, Yousif, et al. A Temperature Characterization of (Si-FinFET) Based on Channel Oxide Thickness. Universitas Ahmad Dahlan, 2019.