Free space microwave characterization of silicon wafers for microelectronic applications / Zaiki Awang, Deepak Kumar Ghodgaonkar and Noor Hasimah Baba

by Awang, Zaiki, Ghodgaonkar, Deepak Kumar, Baba, Noor Hasimah
Published 2005

Microwave non-destructive testing of coatings and paints using free space microwave measurement / Norhayati Hamzah ... [et al.]

by Hamzah, Norhayati, Ghodgaonkar, Deepak Kumar, Che Kasim, Kamal Faizin, Awang, Zaiki
Published 2005