Modeling of the reliability baseline for process control monitoring kerf structures

by Izuddin, Ismah, Kamaruddin, Mohd. Hanif, Nordin, Anis Nurashikin
Published 2011

Trench DMOS interface trap characterization by three-terminal charge pumping measurement

by Izzudin , Ismah, Kamaruddin , Mohd. Hanif, Nordin, Anis Nurashikin, Soin, Norhayati
Published 2012