APA (7th ed.) Citation

Izzudin , I., Kamaruddin , M. H., Nordin, A. N., & Soin, N. (2012). Trench DMOS interface trap characterization by three-terminal charge pumping measurement. Elsevier.

Chicago Style (17th ed.) Citation

Izzudin , Ismah, Mohd. Hanif Kamaruddin , Anis Nurashikin Nordin, and Norhayati Soin. Trench DMOS Interface Trap Characterization by Three-terminal Charge Pumping Measurement. Elsevier, 2012.

MLA (8th ed.) Citation

Izzudin , Ismah, et al. Trench DMOS Interface Trap Characterization by Three-terminal Charge Pumping Measurement. Elsevier, 2012.