Za'bah, N. F., Kwa, K. S. K., & O'Neill, A. (2013). The study on the aspect ratio of Atomic Force Microscope (AFM) measurements for Triangular Silicon Nanowire.
Chicago Style (17th ed.) CitationZa'bah, Nor Farahidah, Kelvin S. K. Kwa, and Anthony O'Neill. The Study on the Aspect Ratio of Atomic Force Microscope (AFM) Measurements for Triangular Silicon Nanowire. 2013.
MLA (8th ed.) CitationZa'bah, Nor Farahidah, et al. The Study on the Aspect Ratio of Atomic Force Microscope (AFM) Measurements for Triangular Silicon Nanowire. 2013.
Warning: These citations may not always be 100% accurate.