Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varyi...
| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2010
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/5304/ http://irep.iium.edu.my/5304/ http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf |