Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes

A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varyi...

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Main Authors:	Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
Format:	Conference or Workshop Item
Language:	English
Published:	2010
Subjects:	Q Science (General) TJ212 Control engineering
Online Access:	http://irep.iium.edu.my/5304/ http://irep.iium.edu.my/5304/ http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf

id	iium-5304
recordtype	eprints
spelling	iium-53042011-10-31T07:50:45Z http://irep.iium.edu.my/5304/ Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Q Science (General) TJ212 Control engineering A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x axis and y axis of an AFM scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing this scanning method on a commercial AFM indicate that the obtained images are of a good quality and the profile of the calibration grating is well captured up to scan frequency of 120 Hz with a scanner where the first resonance frequency is 580 Hz. 2010-06 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf Mahmood, Iskandar Al-Thani and Moheimani, S.O. Reza (2010) Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes. In: American Control Conference (ACC), 30 June - 2 July 2010, Marriott Waterfront, Baltimore, MD, USA. http://a2c2.org/conferences/acc2010/
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	Q Science (General) TJ212 Control engineering
spellingShingle	Q Science (General) TJ212 Control engineering Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
description	A spiral scanning method for high-speed Atomic Force Microscopy (AFM) is described in this paper. In this method, the sample is scanned in a spiral pattern instead of the conventional raster pattern. A spiral scan can be produced by applying single frequency cosine and sine signals with slowly varying amplitudes to the x axis and y axis of an AFM scanner respectively. The use of the single tone input signals allows the scanner to move at high speeds without exciting the mechanical resonance of the device and with relatively small control efforts. These scan methods can be incorporated into most modern AFMs with minimal effort since they can be implemented in software using the existing hardware. Experimental results obtained by implementing this scanning method on a commercial AFM indicate that the obtained images are of a good quality and the profile of the calibration grating is well captured up to scan frequency of 120 Hz with a scanner where the first resonance frequency is 580 Hz.
format	Conference or Workshop Item
author	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza
author_facet	Mahmood, Iskandar Al-Thani Moheimani, S.O. Reza
author_sort	Mahmood, Iskandar Al-Thani
title	Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_short	Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_full	Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_fullStr	Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_full_unstemmed	Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes
title_sort	spiral scanning: an alternative to conventional raster scanning in high-speed scanning probe microscopes
publishDate	2010
url	http://irep.iium.edu.my/5304/ http://irep.iium.edu.my/5304/ http://irep.iium.edu.my/5304/1/Spiral_scanning_-_An_alternative_to_conventional_raster_scanning_in_high-speed_Scanning_Probe_Microscopes.pdf
first_indexed	2023-09-18T20:13:49Z
last_indexed	2023-09-18T20:13:49Z
_version_	1777407654590676992

Spiral scanning: an alternative to conventional raster scanning in high-speed Scanning Probe Microscopes

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