Improvement of accuracy and speed of a commercial AFM using Positive Position Feedback control
The atomic force microscope (AFM) is a device capable of generating topographic images of sample surfaces with extremely high resolutions down to the atomic level. It is also being used in applications that involve manipulation of matter at a nanoscale. Early AFMs were operated in open loop. As a re...
| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2009
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/5305/ http://irep.iium.edu.my/5305/ http://irep.iium.edu.my/5305/1/Improvement_of_accuracy_and_speed_of_a_commercial_AFM_using_positive_position_feedback_control.pdf |