Mohd Khairi, M. A., Ab Rahim, R., Saidin, N., Hasbullah, N. F., & Abdullah, Y. (2018). Reliability study of silicon carbide Schottky Diode with fast electron irradiation. Institute of Electrical and Electronics Engineers Inc.
Chicago Style (17th ed.) CitationMohd Khairi, Mohamad Azim, Rosminazuin Ab Rahim, Norazlina Saidin, Nurul Fadzlin Hasbullah, and Yusof Abdullah. Reliability Study of Silicon Carbide Schottky Diode with Fast Electron Irradiation. Institute of Electrical and Electronics Engineers Inc, 2018.
MLA (8th ed.) CitationMohd Khairi, Mohamad Azim, et al. Reliability Study of Silicon Carbide Schottky Diode with Fast Electron Irradiation. Institute of Electrical and Electronics Engineers Inc, 2018.
Warning: These citations may not always be 100% accurate.