An SEM flashover: technique to characterize wide band gap insulators
This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can...
| Main Authors: | , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2006
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| Subjects: | |
| Online Access: | http://irep.iium.edu.my/9423/ http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf |