An SEM flashover: technique to characterize wide band gap insulators

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can...

Full description

Bibliographic Details
Main Authors:	Sutjipto, Agus Geter Edy, Muhida, Riza, Takata, Masasuke
Format:	Conference or Workshop Item
Language:	English
Published:	2006
Subjects:	TK452 Electric apparatus and materials. Electric circuits. Electric networks
Online Access:	http://irep.iium.edu.my/9423/ http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf

id	iium-9423
recordtype	eprints
spelling	iium-94232012-04-04T04:13:38Z http://irep.iium.edu.my/9423/ An SEM flashover: technique to characterize wide band gap insulators Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke TK452 Electric apparatus and materials. Electric circuits. Electric networks This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can create an electric field distribution in the surface. The increase of electric field at the surface may exceed a critical value when a surface breakdown/flashover occurs. An insulation property can be evaluated by varying the duration of charging/electron bombardment which is needed to initiate an optically-visible flashover treeing formation (hereinafter time to flashover treeing/TTF). In this paper, high purity MgO as a wide band gap insulator material was used as a main investigated sample. Varying addition of high purity SiO2 was used to change insulator property of the MgO. Under a certain SEM's energy and magnification, SiO2 addition has change the duration of charging up to surface breakdown. Therefore, this technique may be useful for investigating an insulation property of materials under electron bombardment such as MgO in a plasma display panel, high voltage insulator, and other insulator materials for space technology. 2006 Conference or Workshop Item PeerReviewed application/pdf en http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf Sutjipto, Agus Geter Edy and Muhida, Riza and Takata, Masasuke (2006) An SEM flashover: technique to characterize wide band gap insulators. In: 8th International Conference on Properties and Applications of Dielectric Materials, 26 - 30 June 2006, Bali, Indonesia.
repository_type	Digital Repository
institution_category	Local University
institution	International Islamic University Malaysia
building	IIUM Repository
collection	Online Access
language	English
topic	TK452 Electric apparatus and materials. Electric circuits. Electric networks
spellingShingle	TK452 Electric apparatus and materials. Electric circuits. Electric networks Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke An SEM flashover: technique to characterize wide band gap insulators
description	This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can create an electric field distribution in the surface. The increase of electric field at the surface may exceed a critical value when a surface breakdown/flashover occurs. An insulation property can be evaluated by varying the duration of charging/electron bombardment which is needed to initiate an optically-visible flashover treeing formation (hereinafter time to flashover treeing/TTF). In this paper, high purity MgO as a wide band gap insulator material was used as a main investigated sample. Varying addition of high purity SiO2 was used to change insulator property of the MgO. Under a certain SEM's energy and magnification, SiO2 addition has change the duration of charging up to surface breakdown. Therefore, this technique may be useful for investigating an insulation property of materials under electron bombardment such as MgO in a plasma display panel, high voltage insulator, and other insulator materials for space technology.
format	Conference or Workshop Item
author	Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke
author_facet	Sutjipto, Agus Geter Edy Muhida, Riza Takata, Masasuke
author_sort	Sutjipto, Agus Geter Edy
title	An SEM flashover: technique to characterize wide band gap insulators
title_short	An SEM flashover: technique to characterize wide band gap insulators
title_full	An SEM flashover: technique to characterize wide band gap insulators
title_fullStr	An SEM flashover: technique to characterize wide band gap insulators
title_full_unstemmed	An SEM flashover: technique to characterize wide band gap insulators
title_sort	sem flashover: technique to characterize wide band gap insulators
publishDate	2006
url	http://irep.iium.edu.my/9423/ http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf
first_indexed	2023-09-18T20:19:07Z
last_indexed	2023-09-18T20:19:07Z
_version_	1777407987780943872

An SEM flashover: technique to characterize wide band gap insulators

Similar Items