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Use of strain-life models with wavelet bump extraction (WBE) for predicting fatigue damage

Use of strain-life models with wavelet bump extraction (WBE) for predicting fatigue damage

Bibliographic Details
Main Authors: Shahrum Abdullah, Choi, Jae-Chil, John R. Yates
Format: Article
Language:English
Published: 2008
Online Access:http://journalarticle.ukm.my/2556/
http://journalarticle.ukm.my/2556/
http://journalarticle.ukm.my/2556/1/2008-4.pdf
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http://journalarticle.ukm.my/2556/
http://journalarticle.ukm.my/2556/
http://journalarticle.ukm.my/2556/1/2008-4.pdf

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