An efficient approach for vision inspection of IC chips
The research aims to develop an automated vision inspection system of IC chips that used to detect the defects of marking and design shape of IC chips.As a result of higher failure probability of manual inspection system, this automated system is developed.The automated vision system will consists o...
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| Format: | Undergraduates Project Papers |
| Language: | English |
| Published: |
2012
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| Online Access: | http://umpir.ump.edu.my/id/eprint/4418/ http://umpir.ump.edu.my/id/eprint/4418/ http://umpir.ump.edu.my/id/eprint/4418/1/CD6551_LIEW_KOK_WAH.pdf |