Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET

by Hatta, Sharifah Wan M., Hussin, Hanim Yati, Soon, F.Y., Abdul Wahab, Yasmin, Abdul Hadi, Dayanasari, Soin, Norhayati, Alam, A. H.M.Zahirul, Nordin, Anis Nurashikin
Published 2017