Characterization of defects generated by copper electrochemical plating process on silicon wafers / Yasmin Abdul Wahab

by Abdul Wahab, Yasmin
Published 2008

Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET

by Hatta, Sharifah Wan M., Hussin, Hanim Yati, Soon, F.Y., Abdul Wahab, Yasmin, Abdul Hadi, Dayanasari, Soin, Norhayati, Alam, A. H.M.Zahirul, Nordin, Anis Nurashikin
Published 2017